About this scholarly article

SPIE Proceedings [SPIE 33rd Annual Techincal Symposium - San Diego (Monday 7 August 1989)] X-Ray/EUV Optics for Astronomy and Microscopy - Surface Roughness And Oxide Layers Of Sputtered Polycrystalline Films by Rohlsberger, R.; Grote, M.; Bergmann, U.; Gerdau, E.; Hollatz, R.; Ruffer, R.; Ruter, H. D.; Sturhahn, W.; Harsdorff, M.; Pfutzner, W.; Hoover, Richard B. is a scholarly article available to read on EtoBox.

Author

Rohlsberger, R.; Grote, M.; Bergmann, U.; Gerdau, E.; Hollatz, R.; Ruffer, R.; Ruter, H. D.; Sturhahn, W.; Harsdorff, M.; Pfutzner, W.; Hoover, Richard B.

Publisher

SPIE

Published

1989

Language

EN