About this scholarly article

Circuit-aging modeling based on dynamic MOSFET degradation and its verification by Rohbani, Nezam ;Miyamoto, Hidenori ;Kikuchihara, Hideyuki ;Navarro, Dondee ;Maiti, Tapas Kumar ;Ma, Chenyue ;Miura-Mattausch, Mitiko ;Miremadi, Seyed-Ghassem ;Mattausch, Hans Jurgen is a scholarly article available to read on EtoBox.

Author

Rohbani, Nezam ;Miyamoto, Hidenori ;Kikuchihara, Hideyuki ;Navarro, Dondee ;Maiti, Tapas Kumar ;Ma, Chenyue ;Miura-Mattausch, Mitiko ;Miremadi, Seyed-Ghassem ;Mattausch, Hans Jurgen

Publisher

IEEE

Published

2017

Language

EN