About this document
MMIC DC Parametric Test Structures Guide by ommidbabaee is a document available to read on EtoBox.
The document outlines the NISTGAAS computer-aided design (CAD) cell library, which provides test structures for measuring parameters in GaAs MMIC devices to enhance manufacturing processes. It details the implementation of these test structures, including design specifications and analysis methods, and serves as a common reference for the microwave community. Sponsored by DARPA and the U.S. Air Force, the library includes eight test structure types, adaptable for various MMIC processes.
- Author
- ommidbabaee
- Language
- EN