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Can I read Erratum to “In-situ monitoring of the dielectric and electrostrictive properties of anodised thin films for biochip applications” [Colloids Surf. B 56 (2007) 163–169] on EtoBox?
Erratum to “In-situ monitoring of the dielectric and electrostrictive properties of anodised thin films for biochip applications” [Colloids Surf. B 56 (2007) 163–169] by J.-F. Vanhumbeeck; J. Proost is a Materials Science article available to read on EtoBox.
What is Erratum to “In-situ monitoring of the dielectric and electrostrictive properties of anodised thin films for biochip applications” [Colloids Surf. B 56 (2007) 163–169] about?
The authors regret that quantification of electrostratic stresses in our original paper was based on an incorrect Eq. ( ). Instead, the appropriate relationship between the in-plane electrostriction stress and the electric field under thin film boundary conditions is as derived correctly in our more recent paper . Owing to the inappropriate use of the original Eq. ( ), the electrostatic stress values listed in the original Table and the corresponding values of the dielectric constant, plotted on the original Fig. were underestimated. Corrected values for both the electrostatic stress and the dielectric constant are presented below in Table and Fig. , respectively. It should be noted that the conclusions of our original paper are not affected by this error.
Who reads Erratum to “In-situ monitoring of the dielectric and electrostrictive properties of anodised thin films for biochip applications” [Colloids Surf. B 56 (2007) 163–169]?
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- J.-F. Vanhumbeeck; J. Proost
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0927-7765)
- Published
- 2009
- Language
- EN
- Field
- Materials Science (Physical Sciences)