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About this Engineering article
Thickness Resonance Acoustic Microscopy for Nanomechanical Subsurface Imaging by Shekhawat, Gajendra S.; Srivastava, Arvind K.; Dravid, Vinayak P.; Balogun, Oluwaseyi is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Shekhawat, Gajendra S.; Srivastava, Arvind K.; Dravid, Vinayak P.; Balogun, Oluwaseyi
- Publisher
- American Chemical Society; American Chemical Society (ACS) (ISSN 1936-0851)
- Published
- 2017
- Language
- EN
- Field
- Engineering (Physical Sciences)