About this scholarly article

SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and testing technologies: Optical test and Measurement Technology and Equipment - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Analysis for maladjustment properties of passive… by Zhang, Xiang; Pan, Junhua; Wyant, James C.; Xiang, Anping; Wang, Hexin is a scholarly article available to read on EtoBox.

Author

Zhang, Xiang; Pan, Junhua; Wyant, James C.; Xiang, Anping; Wang, Hexin

Publisher

SPIE

Published

2007

Language

EN