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About this Engineering article
Effect of Oxide Field on Hot-carrier-induced Degradation of Metal-oxide-semiconductor Field-effect Transistors by Choi, J. Y.; Ko, P. K.; Hu, C. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Choi, J. Y.; Ko, P. K.; Hu, C.
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 1987
- Field
- Engineering (Physical Sciences)