About this scholarly article

SPIE Proceedings [SPIE Photonics Asia 2007 - Beijing, China (Sunday 11 November 2007)] Optical Design and Testing III - Novel method based on DDE technology for computer-aided alignment by Wang, Yongtian; Huang, Yifan; Li, Lin; Tschudi, Theo T.; Rolland, Jannick P.; Tatsuno, Kimio is a scholarly article available to read on EtoBox.

Author

Wang, Yongtian; Huang, Yifan; Li, Lin; Tschudi, Theo T.; Rolland, Jannick P.; Tatsuno, Kimio

Publisher

SPIE

Published

2007