About this scholarly article

2020 IEEE International Reliability Physics Symposium (IRPS) - Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices by Kranthi, Nagothu Karmel; Sampath Kumar, B.; Salman, Akram; Boselli, Gianluca; Shrivastava, Mayank is a scholarly article available to read on EtoBox.

Author

Kranthi, Nagothu Karmel; Sampath Kumar, B.; Salman, Akram; Boselli, Gianluca; Shrivastava, Mayank

Publisher

IEEE

Published

2020