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About this Engineering article
Record Maximum Transconductance of 3.45 mS/μm for III-V FETs by Lin, Jianqiang; Cai, Xiaowei; Wu, Yufei; Antoniadis, Dimitri; del Alamo, Jesus is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Lin, Jianqiang; Cai, Xiaowei; Wu, Yufei; Antoniadis, Dimitri; del Alamo, Jesus
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0741-3106)
- Published
- 2016
- Language
- EN
- Field
- Engineering (Physical Sciences)
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