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About this Engineering article
MEMS reliability for space applications by elimination of potential failure modes through testing and analysis by Man, Kin F. (author) is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Man, Kin F. (author)
- Publisher
- SPIE
- Published
- 1999
- Field
- Engineering (Physical Sciences)