About this Computer Science article
Supervised and Semi-supervised Probabilistic Learning with Deep Neural Networks for Concurrent Process-quality Monitoring by Wang, Kai; Yuan, Xiaofeng; Chen, Junghui; Wang, Yalin is a Computer Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Computer Science.
- Author
- Wang, Kai; Yuan, Xiaofeng; Chen, Junghui; Wang, Yalin
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0893-6080)
- Published
- 2020
- Field
- Computer Science (Physical Sciences)