Skip to content

Opening book details…

About this Engineering article

Atomistic Study of the (001), 90° Twist Boundary in Silicon by Yu Belov, A.; Conarad, D.; Scheerschmidt, K.; Gösele, U. is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Yu Belov, A.; Conarad, D.; Scheerschmidt, K.; Gösele, U.
Publisher
Taylor and Francis Group; Informa UK (Taylor & Francis); Taylor & Francis; Informa UK Limited (ISSN 0141-8610)
Published
1998
Field
Engineering (Physical Sciences)