About this scholarly article

2009 IEEE International Conference on Plasma Science - Abstracts - Plasma diagnostic calibrations and characterizations at National Security Technologies' High Energy X-ray calibration Facility by Ali, Z.A.; Buckles, R.A.; Haugh, M.J.; Traille, A.J.; Maddox, B.R.; Chen, C.D.; DeWald, E.L. is a scholarly article available to read on EtoBox.

Author

Ali, Z.A.; Buckles, R.A.; Haugh, M.J.; Traille, A.J.; Maddox, B.R.; Chen, C.D.; DeWald, E.L.

Publisher

IEEE

Published

2009