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About this Engineering article
A Physical-Location-Aware X-Filling Method for IR-Drop Reduction in At-Speed Scan Test by Wen-Wen Hsieh; Shih-Liang Chen; I-Sheng Lin; TingTing Hwang is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Wen-Wen Hsieh; Shih-Liang Chen; I-Sheng Lin; TingTing Hwang
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0278-0070)
- Published
- 2010
- Field
- Engineering (Physical Sciences)
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