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About this scholarly article
Proceedings. International Test Conference 1990 - State transition graph analysis as a key to BIST fault coverage by Brynestad, O.; Aas, E.J.; Vallestad, A.E. is a scholarly article available to read on EtoBox.
- Author
- Brynestad, O.; Aas, E.J.; Vallestad, A.E.
- Publisher
- IEEE Comput. Soc. Press
- Published
- 1990
- Language
- EN
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