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About this Computer Science article

Test Generation for Sequential Circuits Based on Boolean Function Manipulation by Hoyong Choi; Takashi Kohara; Nagisa Ishiura; Isao Shirakawa; Akira Motohara is a Computer Science article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Computer Science.

Author
Hoyong Choi; Takashi Kohara; Nagisa Ishiura; Isao Shirakawa; Akira Motohara
Publisher
John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley (ISSN 1042-0967)
Published
1993
Language
EN
Field
Computer Science (Physical Sciences)