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About this Materials Science article
Yield analysis of large‐area high‐power single‐chip GaN‐based light‐emitting diodes with network design by Wang, Wei; Cai, Yong; Zhang, Yibin; Huang, Hongjuan; Huang, Wei; Li, Haiou; Zhang, Baoshun is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Wang, Wei; Cai, Yong; Zhang, Yibin; Huang, Hongjuan; Huang, Wei; Li, Haiou; Zhang, Baoshun
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); Wiley - VCH Verlag GmbH & CO. KGaA; Wiley (ISSN 1862-6254)
- Published
- 2014
- Field
- Materials Science (Physical Sciences)