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About this Engineering article
Thermal stability of AlSiCu/Wn+p diodes with and without TiN barrier layer by Wen-Kuan Yeh; Mao-Chieh Chen; Pei-Jan Wang; Lu-Min Liu; Mou-Shiung Lin is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Wen-Kuan Yeh; Mao-Chieh Chen; Pei-Jan Wang; Lu-Min Liu; Mou-Shiung Lin
- Publisher
- Elsevier Science; Elsevier ; Elsevier Sequoia; Elsevier BV (ISSN 0040-6090)
- Published
- 1995
- Field
- Engineering (Physical Sciences)
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