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About this Engineering article

The reliability of coherent structures—a parametric approach : L. A. Cunningham. Microelectron. & Reliab. 12, 441 (1973) is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Publisher
Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
Published
1974
Language
EN
Field
Engineering (Physical Sciences)