Can I read i3070 Series 5i Test Development Guide on EtoBox?

i3070 Series 5i Test Development Guide by Hà Lê is a document available to read on EtoBox.

What is i3070 Series 5i Test Development Guide about?

This document describes test development for the Keysight i3070 Series 5i Lean Inline In-Circuit Test System. It discusses specifying the target system as an inline system, orienting modules in the testhead differently from other systems, and using an optional dual board staging feature to test two boards simultaneously.

Author

Hà Lê

Language

EN