About this scholarly article

2020 IEEE Symposium on VLSI Technology - A Comprehensive Model for Ferroelectric FET Capturing the Key Behaviors: Scalability, Variation, Stochasticity, and Accumulation by Deng, Shan; Yin, Guodong; Chakraborty, Wriddhi; Dutta, Sourav; Datta, Suman; Li, Xueqing; Ni, Kai is a scholarly article available to read on EtoBox.

Author

Deng, Shan; Yin, Guodong; Chakraborty, Wriddhi; Dutta, Sourav; Datta, Suman; Li, Xueqing; Ni, Kai

Publisher

IEEE

Published

2020