Opening book details…
About this Engineering article
Temperature Profiling of VCSELs by Thermoreflectance Microscopy by Farzaneh, M.; Amatya, R.; Luerszen, D.; Greenberg, K.J.; Rockwell, W.E.; Hudgings, J.A. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Farzaneh, M.; Amatya, R.; Luerszen, D.; Greenberg, K.J.; Rockwell, W.E.; Hudgings, J.A.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1041-1135)
- Published
- 2007
- Language
- EN
- Field
- Engineering (Physical Sciences)