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About this Materials Science article
Residual stress and structure characteristics in PZT ferroelectric thin films annealed at different ramp rates by Shengbo Lu; Changming Zuo; Huizhong Zeng; Wen Huang; Hong Ji is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Shengbo Lu; Changming Zuo; Huizhong Zeng; Wen Huang; Hong Ji
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0167-577X)
- Published
- 2006
- Language
- EN
- Field
- Materials Science (Physical Sciences)