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About this Engineering article
Topography-free Sample for Thermal Spatial Response Measurement of Scanning Thermal Microscopy by Ge, Yunfei; Zhang, Yuan; Weaver, Jonathan M. R.; Zhou, Haiping; Dobson, Phillip S. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Ge, Yunfei; Zhang, Yuan; Weaver, Jonathan M. R.; Zhou, Haiping; Dobson, Phillip S.
- Publisher
- AVS (American Vacuum Society); American Vacuum Society; American Institute of Physics; AVS Science and Technology Society (ISSN 1520-8567)
- Published
- 2015
- Field
- Engineering (Physical Sciences)