Skip to content

Opening book details…

About this Engineering article

Development of a Wide-Spectral-Range High-Speed Spectrophotometer System for Measuring Hemispherical Reflectance and Normal Emittance of Surfaces Simultaneously(Thermal Engineering) by MAKINO, Toshiro; WAKABAYASHI, Hidenobu is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
MAKINO, Toshiro; WAKABAYASHI, Hidenobu
Publisher
The Japan Society of Mechanical Engineers; Japan Society of Mechanical Engineers/Nihon Kikai Gakkai; Japan Society of Mechanical Engineers (ISSN 0387-5016)
Published
2009
Field
Engineering (Physical Sciences)

More by MAKINO, Toshiro; WAKABAYASHI, Hidenobu

Browse all works by MAKINO, Toshiro; WAKABAYASHI, Hidenobu