About this document
Interconnect Capacitance in VLSI Systems by muzzammilanwarranchi is a document available to read on EtoBox.
The document discusses interconnect parameters in VLSI systems, including capacitive, resistive, and inductive parasitics. It describes how interconnect capacitance is modeled, including contributions from parallel-plate and fringing capacitance. Resistance of interconnect wires depends on material resistivity and wire dimensions. Advanced techniques like silicided polysilicon and contacts help reduce resistance. The document provides design guidance on minimizing parasitic effects.
- Author
- muzzammilanwarranchi
- Language
- EN