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Dead‐time correction of synchrotron radiation‐based XRF measurements at decaying storage ring current by W. Görner is a Physics and Astronomy article available to read on EtoBox.

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## Abstract Strong requirements due to the certification of reference materials or to lowering substantially the limits of determination of elements may require the analyst using XRF at a synchrotron beamline to carry out very long measurements, especially during unattended night runs. In this case, the problem of correction of the combined effect of the exponentially decaying fluorescence radiation, caused by the diminishing electron current of the storage ring, and the resulting time‐dependent dead‐time fraction of the spectrometer has to be faced. This effect cannot be treated solely by dead‐time meter or by beam monitor and will deteriorate the quantitative correctness of the analytical results. Fortunately, the exponential behaviour of the irradiating beam transfers to all components of the fluorescence spectrum. Therefore, it is possible to obtain an analytical solution for the time integral of the measurement. The equation is identical with that found for the dead‐time affected measurement of a pure short‐lived isotope. Graphs for correcting the apparent peak pulse rates in order to obtain true rates at the beginning of the measurement and for error propagation of half‐life

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Author

W. Görner

Publisher

John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley (ISSN 0049-8246)

Published

2005

Language

EN

Field

Physics and Astronomy (Physical Sciences)