About this scholarly article

Fourth International Symposium on Quality Electronic Design, 2003. Proceedings. - Design and use of memory-specific test structures to ensure SRAM yield and manufacturability by Duan, F.; Castagnetti, R.; Venkatraman, R.; Kobozeva, O.; Ramesh, S. is a scholarly article available to read on EtoBox.

Author

Duan, F.; Castagnetti, R.; Venkatraman, R.; Kobozeva, O.; Ramesh, S.

Publisher

IEEE Comput. Soc

Published

2003

Language

EN