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About this Engineering article
A New Approach for Fast Analysis of Spurious Emissions From RF/Microwave Circuits by Hsieh, Han-Chang; Chiu, Cheng-Nan; Wang, Chi-Hsueh; Chen, Chun Hsiung is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Hsieh, Han-Chang; Chiu, Cheng-Nan; Wang, Chi-Hsueh; Chen, Chun Hsiung
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9375)
- Published
- 2009
- Language
- EN
- Field
- Engineering (Physical Sciences)