Opening book details…
About this Engineering article
Efficient Mode-matching Analysis of Discontinuities in Finite Planar Substrates Using Perfectly Matched Layers by Derudder, H.; Olyslager, F.; De Zutter, D.; Van den Berghe, S. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Derudder, H.; Olyslager, F.; De Zutter, D.; Van den Berghe, S.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-926X)
- Published
- 2001
- Language
- EN
- Field
- Engineering (Physical Sciences)
More by Derudder, H.; Olyslager, F.; De Zutter, D.; Van den Berghe, S.
Browse all works by Derudder, H.; Olyslager, F.; De Zutter, D.; Van den Berghe, S.