Skip to content

Opening book details…

About this Engineering article

Parametric Probabilistic Approach for Cumulative Fatigue Damage Using Double Linear Damage Rule Considering Limited Data by Paulo Dias, João; Ekwaro-Osire, Stephen; Cunha, Americo; Dabetwar, Shweta; Nispel, Abraham; Alemayehu, Fisseha M.; Endeshaw, Haileyesus B. is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Paulo Dias, João; Ekwaro-Osire, Stephen; Cunha, Americo; Dabetwar, Shweta; Nispel, Abraham; Alemayehu, Fisseha M.; Endeshaw, Haileyesus B.
Publisher
Elsevier Science; Elsevier ; Elsevier BV (ISSN 0142-1123)
Published
2019
Field
Engineering (Physical Sciences)

More by Paulo Dias, João; Ekwaro-Osire, Stephen; Cunha, Americo; Dabetwar, Shweta; Nispel, Abraham; Alemayehu, Fisseha M.; Endeshaw, Haileyesus B.

Browse all works by Paulo Dias, João; Ekwaro-Osire, Stephen; Cunha, Americo; Dabetwar, Shweta; Nispel, Abraham; Alemayehu, Fisseha M.; Endeshaw, Haileyesus B.