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About this Engineering article
Resistive Switching: Real‐Time Observation on Dynamic Growth/Dissolution of Conductive Filaments in Oxide‐Electrolyte‐Based ReRAM (Adv. Mater. 14/2012) by Qi Liu; Jun Sun; Hangbing Lv; Shibing Long; Kuibo Yin; Neng Wan; Yingtao Li; Litao Sun; Ming Liu is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Qi Liu; Jun Sun; Hangbing Lv; Shibing Long; Kuibo Yin; Neng Wan; Yingtao Li; Litao Sun; Ming Liu
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); Wiley-Blackwell; Wiley; Research Square (ISSN 0935-9648)
- Published
- 2012
- Field
- Engineering (Physical Sciences)