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About this Physics and Astronomy article
Microscopic Four-point Atomic Force Microscope Probe Technique for Local Electrical Conductivity Measurement by Ju, Yang; Ju, Bing-Feng; Saka, Masumi is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Ju, Yang; Ju, Bing-Feng; Saka, Masumi
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0034-6748)
- Published
- 2005
- Language
- EN
- Field
- Physics and Astronomy (Physical Sciences)