About this scholarly article

2018 IEEE International Reliability Physics Symposium (IRPS) - Low frequency noise in MOS2 negative capacitance field-effect transistor by Alghamdi, Sami; Si, Mengwei; Yang, Lingming; Ye, Peide D. is a scholarly article available to read on EtoBox.

Author

Alghamdi, Sami; Si, Mengwei; Yang, Lingming; Ye, Peide D.

Publisher

IEEE

Published

2018

Language

EN