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About this Engineering article
Proton Irradiation Experiment for X-ray Charge-Coupled Devices of the Monitor of All-Sky X-ray Image Mission Onboard the International Space Station: II. Degradation of Dark Current and Identification of Electron Trap Level by E. Miyata; H. Kouno; D. Kamiyama; T. Kamazuka; M. Mihara; M. Fukuda; K. Matsuta; H. Tsunemi; T. Minamisono; H. Tomida; K. Miyaguchi is a Engineering article available to read on EtoBox.
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- Author
- E. Miyata; H. Kouno; D. Kamiyama; T. Kamazuka; M. Mihara; M. Fukuda; K. Matsuta; H. Tsunemi; T. Minamisono; H. Tomida; K. Miyaguchi
- Publisher
- Institute of Pure and Applied Physics; Japan Society of Applied Physics; IOP Publishing (ISSN 0021-4922)
- Published
- 2003
- Field
- Engineering (Physical Sciences)