Opening book details…
About this Engineering article
Spatially resolved Fourier transform impedance spectroscopy: A technique to rapidly characterize interfaces, applied to a QD/SiC heterojunction by Kelley, Mathew L. (author);Simin, Grigory (author);Hussain, Kamal (author);Khan, Asif (author);Greytak, Andrew B. (author);Chandrashekhar, M. V. S. (author) is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kelley, Mathew L. (author);Simin, Grigory (author);Hussain, Kamal (author);Khan, Asif (author);Greytak, Andrew B. (author);Chandrashekhar, M. V. S. (author)
- Publisher
- AIP Publishing
- Published
- 2021
- Field
- Engineering (Physical Sciences)