About this scholarly article

2007 IEEE International Test Conference - On-chip timing uncertainty measurements on IBM microprocessors by Franch, R.; Restle, P.; James, N.; Huott, W.; Friedrich, J.; Dixon, R.; Weitzel, S.; Van Goor, K.; Salem, G. is a scholarly article available to read on EtoBox.

Author

Franch, R.; Restle, P.; James, N.; Huott, W.; Friedrich, J.; Dixon, R.; Weitzel, S.; Van Goor, K.; Salem, G.

Publisher

IEEE

Published

2007