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This work is focused on the application of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to the surface studies of deactivation-regeneration process of Pd/TiO 2 catalyst used in the hydrodechlorination of CCl 4 . 7-13 ## Electron impact total ionization cross sections for halogens and their hydrides Minaxi Vinodkumar, Rucha Dave, Harshad Bhutadia, Bobby K. Antony Calculation for electron impact total ionization cross sections on halogen atoms (F, Cl, Br and I) and their hydrides (HF, HCl, HBr and HI) are performed employing Spherical Complex Optical Potential and Complex Optical Potentialionization contribution formalisms for energies ranging from above threshold to 2000 eV. The results are compared with other data wherever available. It is found that the present result gives a better account of the ionization cross sections.
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- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 1387-3806)
- Published
- 2010
- Language
- EN
- Field
- Chemistry (Physical Sciences)