Skip to content

Opening book details…

About this Engineering article

HfTiAlO dielectric as an alternative high-k gate dielectric for the next generation of complementary metal-oxide-semiconductor devices by Lu, N.; Li, H.-J.; Peterson, J. J.; Kwong, D. L. is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Lu, N.; Li, H.-J.; Peterson, J. J.; Kwong, D. L.
Publisher
American Institute of Physics; AIP Publishing (ISSN 0003-6951)
Published
2007
Language
EN
Field
Engineering (Physical Sciences)

More by Lu, N.; Li, H.-J.; Peterson, J. J.; Kwong, D. L.

Browse all works by Lu, N.; Li, H.-J.; Peterson, J. J.; Kwong, D. L.