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About this Engineering article
Investigation of gate oxide breakdown in CMOS integrated circuits by B. Peŝić; S. Dimitrijev; N. Stojadinović is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- B. Peŝić; S. Dimitrijev; N. Stojadinović
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd; Elsevier BV (ISSN 0026-2692)
- Published
- 1989
- Field
- Engineering (Physical Sciences)