Skip to content

Opening book details…

Can I read X-ray And Neutron Reflectivity: Principles And Applications (lecture Notes In Physics) on EtoBox?

X-ray And Neutron Reflectivity: Principles And Applications (lecture Notes In Physics) by F. de Bergevin (auth.), Jean Daillant, Alain Gibaud (eds.) is a mathematics available to read on EtoBox.

What is X-ray And Neutron Reflectivity: Principles And Applications (lecture Notes In Physics) about?

Point processes and random measures find wide applicability in telecommunications, earthquakes, image analysis, spatial point patterns and stereology, to name but a few areas. The authors have made a major reshaping of their work in their first edition of 1988 and now present An Introduction to the Theory of Point Processes in two volumes with subtitles Volume I: Elementary Theory and Methods and Volume II: General Theory and Structure. Volume I contains the introductory chapters from the first

Who reads X-ray And Neutron Reflectivity: Principles And Applications (lecture Notes In Physics)?

It is typically read by self-directed learners exploring a subject in depth.

Common subject areas: history, science, philosophy, social sciences.

Author
F. de Bergevin (auth.), Jean Daillant, Alain Gibaud (eds.)
Publisher
Springer-Verlag Berlin Heidelberg
Published
2009
Language
EN
ISBN
9780387498355
Category
mathematics
Subjects
Science, Technology, Chemistry
Updated
2026-03-25

Other editions & translations

More by F. de Bergevin (auth.), Jean Daillant, Alain Gibaud (eds.)

Browse all works by F. de Bergevin (auth.), Jean Daillant, Alain Gibaud (eds.)

Similar books