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Tof‐SIMS studies on chlorhexidine and its reaction products with sodium hypochlorite to ascertain decomposition products by R. Sodhi; S. Manek; E. Fillery; B. Basrani is a Engineering article available to read on EtoBox.

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## Abstract The combination of sodium hypochlorite (NaOCl) and Chlorhexidine (CHX), results in the formation of a precipitate. Previous studies have been conducted to find at which concentrations the precipitate appeared and its identity. One postulate is that when CHX breaks down that one of its products is the toxic para‐chloroaniline. Both X‐Ray photoelectron spectroscopy (XPS) and Time‐of‐Flight Secondary Ion Mass Spectrometry have been used to qualify and quantify the precipitation. A problem that exists with both techniques is that the breakdown components are likely to show similar functionalities/fragments as those in CHX. Thus the presence of the breakdown components can only be surmised. For example, CHX shows peaks at 127, 153, 170 and 195 in the positive ToF‐SIMS spectrum corresponding to various molecular fragments from the parent CHX molecule arising from the breaking of the various C to N bonds. However, the major peak for chloroaniline is also that at 127. The positive ToF‐SIMS spectrum of the precipitate (after DI‐water wash) shows these fragments as well as a peak at 111 correlating with the NaOCl concentration. However, importantly, there is no evidence of the CH

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Author

R. Sodhi; S. Manek; E. Fillery; B. Basrani

Publisher

John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley; Research Square (ISSN 0142-2421)

Published

2011

Language

EN

Field

Engineering (Physical Sciences)