About this scholarly article

The Sixteenth Annual International Conference on Micro Electro Mechanical Systems, 2003. MEMS-03 Kyoto. IEEE - A novel stress sensor based on the transverse pseudo-Hall effect of MOSFETs by Doelle, M.; Ruther, P.; Paul, O. is a scholarly article available to read on EtoBox.

Author

Doelle, M.; Ruther, P.; Paul, O.

Publisher

IEEE

Published

2003