About this scholarly article

2011 IEEE Applied Power Electronics Colloquium (IAPEC) - Automated test set-up for reverse recovery characterization of ultrafast diodes by Stahl, Juergen; Kuebrich, Daniel; Duerbaum, Thomas is a scholarly article available to read on EtoBox.

Author

Stahl, Juergen; Kuebrich, Daniel; Duerbaum, Thomas

Publisher

IEEE

Published

2011

Language

EN