About this scholarly article

SPIE Proceedings [SPIE International Workshop on New Approaches to High Tech Materials: Nondestructive Testing and Computer Simulations in Materials Scienc - St. Petersburg, Russia (Monday 9 June 1997)] International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering - Phase image testing of the internal… by Ingal, Viktor N.; Beliaevskaya, Elena A.; Melker, Alexander I. is a scholarly article available to read on EtoBox.

Author

Ingal, Viktor N.; Beliaevskaya, Elena A.; Melker, Alexander I.

Publisher

SPIE

Published

1998