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About this Physics and Astronomy article
The Impact of Shallow-Trench-Isolation Mechanical Stress on the Hysteresis Effect of Partially Depleted Silicon-on-Insulator n-Type Metal-Oxide-Semiconductor Field Effects by Luo, Jie-Xin; Chen, Jing; Chai, Zhan; Lü, Kai; He, Wei-Wei; Yang, Yan; Wang, Xi is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Luo, Jie-Xin; Chen, Jing; Chai, Zhan; Lü, Kai; He, Wei-Wei; Yang, Yan; Wang, Xi
- Publisher
- Institute of Physics; IOP Publishing; Institute of Physics Publishing (ISSN 0256-307X)
- Published
- 2014
- Field
- Physics and Astronomy (Physical Sciences)
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