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About this Engineering article
X-ray spectrometry and photoelectron spectroscopy applied to the study of layered samples: SiO2 and SiOx films on InSb by R. H. Packwood; G. Remond; P. H. Holloway is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- R. H. Packwood; G. Remond; P. H. Holloway
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley; Research Square (ISSN 0142-2421)
- Published
- 1988
- Language
- EN
- Field
- Engineering (Physical Sciences)
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