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About this Engineering article

Defect Effect on Electrical Transport of Multiwalled Carbon Nanotubes by Hsiou, Yu-Feng; Chen, Chiidong; Chan, Ching-Hsu; Stobinski, Leszek; Yang, Ying-Jay is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Hsiou, Yu-Feng; Chen, Chiidong; Chan, Ching-Hsu; Stobinski, Leszek; Yang, Ying-Jay
Publisher
Institute of Pure and Applied Physics; Japan Society of Applied Physics; IOP Publishing (ISSN 0021-4922)
Published
2005
Field
Engineering (Physical Sciences)

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