About this scholarly article

SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2014 - Beijing, China (Tuesday 13 May 2014)] International Symposium on Optoelectronic Technology and Application 2014: Image Processing and Pattern Recognition - Fast 3D reconstruction of tool wear based on monocular vision and multi-color structured light illuminator by Sharma, Gaurav; Zhou, Fugen; Liu, Jennifer; Wang, Zhongren; Li, Bo; Zhou, Yuebin is a scholarly article available to read on EtoBox.

Author

Sharma, Gaurav; Zhou, Fugen; Liu, Jennifer; Wang, Zhongren; Li, Bo; Zhou, Yuebin

Publisher

SPIE

Published

2014